Measurement of in-plane strains using electronic speckle and electronic speckle-shearing pattern interferometry

Journal of Modern Optics

Volumn 43, Issue 8, 1996, Pages 1577-1581

  Rastogi, Pramod K ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT; LIGHT; OPTICS; SPECKLE; STRAIN MEASUREMENT;

IN-PLANE DISPLACEMENTS; PARTIAL DERIVATIVES;

INTERFEROMETRY;

EID: 0030215434     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500349608232830     Document Type: Article

References (6)

1. Lokberg, O. J., 1993. “ Chapter 4 ”. In Speckle Metrology, Edited by:Sirohi, R. S., 157New York:Marcel Dekker. p.
2. Rastogi, P. K., 1993. “ Chapter 2 ”. In Speckle Metrology, Edited by:Sirohi, R. S., 41New York:Marcel Dekker. p.
3. Sirohi, R. S., 1993. “ Chapter 3 ”. In Speckle Metrology, Edited by:Sirohi, R. S., 99New York:Marcel Dekker. p.
4. Hung, Y. Y., 1978. “ Chapter 4 ”. In Speckle Metrology, Edited by:Erf, R. K., 51New York:Academic Press. p.
5. Petzing, J. N., and Tyrer, J. R., Proceedings of the SPIE, Vol. 2342, 27Bellingham, Washington:SPIE.
6. Waldner, S., and Aebischer, H. A., 1996. Optics and Lasers in Engineering, in press.