Hydrogen-induced platelets in disordered silicon

Solid State Communications

Volumn 99, Issue 6, 1996, Pages 427-431

  Nickel, N H ^a   Anderson, G B ^a   Walker, J ^a  

^a PALO ALTO RESEARCH CENTER   (United States)

Author keywords

A. disordered systems; A. semiconductors; C. grain boundaries; C. scanning and transmission electron microscopy

Indexed keywords

CRYSTAL DEFECTS; GRAIN BOUNDARIES; HYDROGEN; MICROSCOPIC EXAMINATION; SEMICONDUCTING SILICON;

DISORDERED SILICON; HYDROGEN PASSIVATION;

SEMICONDUCTOR MATERIALS;

EID: 0030215138     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1098(96)00283-9     Document Type: Article

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