Characteristic stabilization of thin film platinum thermometers during thermal cycling between 5 K and 300 K

Cryogenics

Volumn 36, Issue 8, 1996, Pages 631-634

  Zahariev, A L ^a   Dimitrov, D A ^a   Georgiev, J K ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

Author keywords

Calibration; Thermal cycling; Thin film platinum resistance thermometers

Indexed keywords

AGING OF MATERIALS; CALIBRATION; HEAT RESISTANCE; PLATINUM; POLYNOMIALS; SENSORS; THERMAL CYCLING; THIN FILMS;

PRECISION MEASUREMENT; REPRODUCIBILITY; TEMPERATURE RANGE; THIN FILM PLATINUM SENSORS; THIN FILM PLATINUM THERMOMETERS;

THERMOMETERS;

EID: 0030215060     PISSN: 00112275     EISSN: None     Source Type: Journal    
DOI: 10.1016/0011-2275(96)00053-7     Document Type: Article

References (4)

1. Iye, V. Cryogenics (1988) 28 164-168
2. Dimitrov, D.A., Zahariev, A.L., Georgiev, J.K., Kolev, G.A., Petrinski, J.N. and Ivanov, Tz. Cryogenics (1994) 34 487-489
3. Magnum, B.W. and Evans, G.A. Temperature. Its Measurement and Control in Science and Industry, American Institute of Physics, New York (1982) 5 795
4. Dimitrov, D.A., Terzijska, B.M., Guevezov, V. and Kovachev, V.T. Cryogenics (1990) 30 348-350