On evaluating and optimizing weights for weighted random pattern testing

IEEE Transactions on Computers

Volumn 45, Issue 8, 1996, Pages 904-916

  Majumdar, Amitava ^a  

^a Sunrise Test Systems Inc   (United States)

Author keywords

Built in self test; Heterogeneous urn sampling; Waiting time distribution; Weighted random pattern testing

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; COMPUTATIONAL COMPLEXITY; COMPUTER CIRCUITS; COMPUTER TESTING; OPTIMIZATION; RANDOM PROCESSES;

BUILT IN SELF TEST; HETEROGENOUS URN SAMPLING; SIGNAL PROBABILITY; WAITING TIME DISTRIBUTION; WEIGHT SET; WEIGHTED RANDOM PATTERN TESTS;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0030215057     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.536233     Document Type: Review

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