Substrate-mediated anisotropy of transport properties in YBa2Cu3O7-δ thin films

Solid State Communications

Volumn 99, Issue 8, 1996, Pages 553-557

  Haage, T ^a   Li, J Q ^a   Leibold, B ^a   Cardona, M ^a   Zegenhagen, J ^a   Habermeier, H U ^a   Forkl, A ^b   Jooss, Ch ^b   Warthmann, R ^b   Kronmuller H ^b  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

A. high Tc superconductors; A. thin films; C. scanning and transmission electron microscopy; C. scanning tunneling microscopy; D. flux pinning and creep

Indexed keywords

ANISOTROPY; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL MICROSTRUCTURE; ELECTRIC CONDUCTIVITY; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES; YTTRIUM COMPOUNDS;

FLUX PINNING; GROWTH MORPHOLOGY; MAGNETIC FLUX DENSITY; TRANSLATIONAL BOUNDARIES; TWIN BOUNDARIES;

SUPERCONDUCTING FILMS;

EID: 0030214916     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1098(96)00287-6     Document Type: Article

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