Effects and modeling of simultaneous switching noise for BiCMOS off-chip drivers

IEEE Transactions on Components Packaging and Manufacturing Technology Part B

Volumn 19, Issue 3, 1996, Pages 473-480

  Secker, David A ^b   Prince, John L ^a,c  

^a IEEE

^b RAMBUS INC   (United States)

^c University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CAPACITANCE; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC RESISTANCE; FEEDBACK; MOSFET DEVICES; SEMICONDUCTOR DEVICE MODELS; SWITCHING; TRANSIENTS;

FORWARD CURRENT GAIN; FORWARD TRANSIT TIME; HIGH LEVEL INJECTION EFFECTS; OFF CHIP DRIVERS; SIMULTANEOUS SWITCHING NOISE;

SPURIOUS SIGNAL NOISE;

EID: 0030214754     PISSN: 10709894     EISSN: None     Source Type: Journal    
DOI: 10.1109/96.533885     Document Type: Article

References (11)

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