"Gate-to-gate" BJT obtained from the double-gate input JFET to reset charge preamplifiers

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 377, Issue 2-3, 1996, Pages 453-458

  Fazzi, Alberto ^a   Rehak, Pavel ^b  

^a POLITECNICO DI MILANO   (Italy)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITORS; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; GATES (TRANSISTOR); LEAKAGE CURRENTS; MATHEMATICAL MODELS; NUCLEAR INSTRUMENTATION; SEMICONDUCTOR JUNCTIONS;

BOTTOM GATE; DIRECT CURRENT STABILITY; FEEDBACK LOOP; GATE CHANNEL REVERSED BIASED JUNCTION; GATE TO GATE BIPOLAR JUNCTION TRANSISTOR; P N JUNCTION; RESET TRANSISTOR; RESTORATION CURRENT;

JUNCTION GATE FIELD EFFECT TRANSISTORS;

EID: 0030214704     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(96)00238-0     Document Type: Article

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