|
Volumn 165, Issue 3, 1996, Pages 341-344
|
Optical in situ monitoring of solid phase crystallization of amorphous silicon
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ACTIVATION ENERGY;
AMORPHOUS FILMS;
AMORPHOUS SILICON;
CALCULATIONS;
CHEMICAL VAPOR DEPOSITION;
CRYSTAL GROWTH;
LIGHT TRANSMISSION;
MONITORING;
NUCLEATION;
OPTICAL PROPERTIES;
CRYSTALLINE NUCLEI;
OPTICAL CONSTANTS;
OPTICAL IN SITU MONITORING;
RANDOM NUCLEATION;
SOLID PHASE CRYSTALLIZATION;
CRYSTALLIZATION;
|
EID: 0030214356
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-0248(96)00254-0 Document Type: Article |
Times cited : (18)
|
References (17)
|