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Volumn 165, Issue 3, 1996, Pages 341-344

Optical in situ monitoring of solid phase crystallization of amorphous silicon

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; AMORPHOUS FILMS; AMORPHOUS SILICON; CALCULATIONS; CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; LIGHT TRANSMISSION; MONITORING; NUCLEATION; OPTICAL PROPERTIES;

EID: 0030214356     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(96)00254-0     Document Type: Article
Times cited : (18)

References (17)
  • 12
    • 0038987314 scopus 로고
    • Ed. R.W. Cahn North-Holland, Amsterdam
    • J.W. Christian, in: Physical Metallurgy, 2nd ed., Ed. R.W. Cahn (North-Holland, Amsterdam, 1970) pp. 471-587.
    • (1970) Physical Metallurgy, 2nd Ed. , pp. 471-587
    • Christian, J.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.