Magnetic field dependence of exciton oscillator strength by measurements of magnetoexciton-polariton mode splitting in quantum wells with a microcavity

Applied Physics Letters

Volumn 69, Issue 7, 1996, Pages 887-889

  Tanaka, Takuji ^a   Zhang, Zhenlong ^a   Nishioka, Masao ^a   Arakawa, Yasuhiko ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAVITY RESONATORS; EXCITONS; LIGHT ABSORPTION; LIGHT REFLECTION; MAGNETIC FIELD EFFECTS; MATRIX ALGEBRA; PHOTONS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; VARIATIONAL TECHNIQUES;

EXCITON OSCILLATOR STRENGTH; MAGNETOEXCITON POLARITON MODE SPLITTING; MICROCAVITY; REFLECTIVITY; TRANSFER MATRIX METHOD;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0030214284     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117977     Document Type: Article

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