Investigation of de Josephson current distribution in double-barrier three-terminal devices with a thin middle superconducting layer

Journal of Applied Physics

Volumn 80, Issue 4, 1996, Pages 2321-2326

  Nevirkovets, I P ^a   Doderer, T ^b   Laub, A ^b   Blamire, M G ^c   Evetts, J E ^c  

^a INSTITUTE OF METAL PHYSICS   (Ukraine)

^b UNIVERSITY OF TÜBINGEN   (Germany)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; ELECTRIC CURRENT DISTRIBUTION; ELECTRON BEAMS; ELECTRON TUNNELING; LOW TEMPERATURE OPERATIONS; MAGNETIC FIELD EFFECTS; NIOBIUM; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTING FILMS; X RAY DIFFRACTION;

COOPER PAIR TUNNELING; JOSEPHSON PENETRATION DEPTH; PARASITIC MAGNETIC FLUX; PHASE DIFFERENCE DISTRIBUTION;

JOSEPHSON JUNCTION DEVICES;

EID: 0030214106     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363064     Document Type: Article

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