A model for incorporating the effects of nonzero switching-time constants in electrooptic masks used in hadamard-transform spectrometry

IEEE Transactions on Instrumentation and Measurement

Volumn 45, Issue 4, 1996, Pages 800-804

  Xiong, Jize ^a   Dyer, Ruth A ^b   Dyer, Stephen A ^a  

^a TEXAS INSTRUMENTS   (United States)

^b Kansas State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISTORTION; ELECTRIC VARIABLES MEASUREMENT; ELECTROOPTICAL DEVICES; MONOCHROMATORS; SIGNAL DETECTION; SIGNAL TO NOISE RATIO; SPECTROMETRY; SWITCHING;

ELECTROOPTIC MASKS; HADAMARD TRANSFORM SPECTROMETRY; SIGNAL RECOVERY PROCESS; WALSH-HADAMARD TRANSFORM;

SPECTROMETERS;

EID: 0030213096     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.516999     Document Type: Article

References (12)

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