Electro-optic sampling system for the testing of high-speed integrated circuits using a free running solid-state laser

Journal of Lightwave Technology

Volumn 14, Issue 8, 1996, Pages 1788-1793

  Hofmann, Ralf ^b   Pfleiderer, Hans Jörg ^a,b,c,d,e,f  

^a IEEE

^b UNIVERSITY OF ULM   (Germany)

^c UNIVERSITY OF STUTTGART   (Germany)

^d IBM T J WATSON RESEARCH CENTER   (United States)

^e SIEMENS AG   (Germany)

^f Microlectron Res Lab of Siemens

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC VARIABLES MEASUREMENT; INTEGRATED CIRCUIT TESTING; LASER PULSES; LIGHT SOURCES; NEODYMIUM LASERS; OPTICAL FIBERS; SIGNAL NOISE MEASUREMENT; SOLID STATE LASERS; TIME DOMAIN ANALYSIS;

ARGON ION LASER; ELECTROOPTIC SAMPLING SYSTEM; FIBER OPTIC TRANSMISSION LINE; FIBER OPTIC TRANSMISSION LINKS; SOLID STATE LASER SYSTEM;

ELECTROOPTICAL DEVICES;

EID: 0030212585     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.532015     Document Type: Article

References (7)

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