Two-layer model for photomodulated thermoreflectance of semiconductor wafers

Journal of Applied Physics

Volumn 80, Issue 3, 1996, Pages 1713-1725

  Christofides, C ^a   Diakonos, F ^a   Seas, A ^a   Christou, C ^a   Nestoros, M ^a   Mandelis, A ^a,b  

^a UNIVERSITY OF CYPRUS   (Cyprus)

^b UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COMPUTER SIMULATION; DIFFERENTIAL EQUATIONS; ELECTRONIC PROPERTIES; MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; OPTICAL PROPERTIES; PLASMAS; REFLECTOMETERS; SPURIOUS SIGNAL NOISE; THERMODYNAMIC PROPERTIES;

HANKEL TRANSFORMS; OVERLAYERS; PHOTOMODULATED THERMOREFLECTANCE; PLASMA WAVE EFFECTS; TWO LAYER MODEL;

SEMICONDUCTOR DEVICES;

EID: 0030212401     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362970     Document Type: Article

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