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International Journal of Infrared and Millimeter Waves

Volumn 17, Issue 8, 1996, Pages 1419-1430

Attenuation and propagation in various finline structures

(1) Fernandas, Humberto César Chaves a

a FEDERAL UNIVERSITY OF RIO GRANDE DO NORTE (Brazil)

Author keywords

Antipodal; Bilateral; Complex Propagation; Finline; TTL method; Unilateral

Indexed keywords

ELECTRIC IMPEDANCE; ELECTROMAGNETIC WAVE ATTENUATION; ELECTROMAGNETIC WAVE PROPAGATION; ESTIMATION; PERMITTIVITY; SUBSTRATES; TRANSMISSION LINE THEORY; WAVEFORM ANALYSIS;

ATTENUATION CONSTANT; CHARACTERISTIC IMPEDANCE; COMPLEX PROPAGATION; EFFECTIVE DIELECTRIC CONSTANT; FINLINE; FULL WAVE ANALYSIS; PROPAGATION CONSTANT; TRANSVERSE TRANSMISSION LINE;

ELECTRIC LINES;

EID: 0030212272 PISSN: 01959271 EISSN: None Source Type: Journal
DOI: 10.1007/BF02068792 Document Type: Article

Times cited : (17)

References (8)

1
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2
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- Fernandes, H.C.C.¹

3
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4
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- Characterization of Unilateral Finlines considering the conductor thickness
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5
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6
- 0026155951
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- H.C.C. Fernandes, J.R.S. Oliveira and A.J. Giarola, "Dispersion in Finlines on Semiconductor and the S-Parameter of a step discontinuity ", International Journal of Infrared and Millimeter Waves, U.S.A., vol. 12, n°5, pp. 505-519, May 1991.
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7
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- U.S.A.
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8
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- Kitazawa, T.¹ Mittra, R.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.