메뉴 건너뛰기




Volumn 378, Issue 1-2, 1996, Pages 337-342

A spectrometer for the measurement of the Doppler broadening of the annihilation line with efficient reduction of background

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; COPPER; DATA ACQUISITION; ELECTRONS; NICKEL; PARTICLE DETECTORS; SILICON; SINGLE CRYSTALS; SPECTROSCOPY;

EID: 0030211360     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(96)00423-8     Document Type: Article
Times cited : (14)

References (11)
  • 5
    • 0042971299 scopus 로고
    • Positron annihilation
    • eds. Zs. Kajcsos and Cs. Szeles
    • D.J. Britton, W. Junker and P. Sperr, Positron Annihilation, eds. Zs. Kajcsos and Cs. Szeles, Materials Science Forum 105-110 (1992) p. 1845.
    • (1992) Materials Science Forum , vol.105-110 , pp. 1845
    • Britton, D.J.1    Junker, W.2    Sperr, P.3
  • 10
    • 0003496130 scopus 로고
    • McGraw-Hill, New York
    • B.G. Williams, Compton Scattering (McGraw-Hill, New York, 1977); M.J. Cooper, Rep. Prog. Phys. 48 (1985) 415.
    • (1977) Compton Scattering
    • Williams, B.G.1
  • 11
    • 36149045308 scopus 로고
    • B.G. Williams, Compton Scattering (McGraw-Hill, New York, 1977); M.J. Cooper, Rep. Prog. Phys. 48 (1985) 415.
    • (1985) Rep. Prog. Phys. , vol.48 , pp. 415
    • Cooper, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.