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Volumn 378, Issue 1-2, 1996, Pages 337-342
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A spectrometer for the measurement of the Doppler broadening of the annihilation line with efficient reduction of background
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Author keywords
[No Author keywords available]
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Indexed keywords
BAND STRUCTURE;
COPPER;
DATA ACQUISITION;
ELECTRONS;
NICKEL;
PARTICLE DETECTORS;
SILICON;
SINGLE CRYSTALS;
SPECTROSCOPY;
ANNIHILATION LINE;
BACKGROUND;
DOPPLER BROADENING SPECTROSCOPY;
ENERGY RESOLUTION;
POSITRON ELECTRON PAIR;
DOPPLER EFFECT;
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EID: 0030211360
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-9002(96)00423-8 Document Type: Article |
Times cited : (14)
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References (11)
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