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Volumn 161, Issue , 1996, Pages 287-291
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Hysteresis loops of cobalt films deposited obliquely by sputtering
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Author keywords
Anisotropy; Grain structure; Hysteresis loop; Remanence; Shultz method; Texture
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Indexed keywords
COBALT;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
ELECTRON MICROSCOPY;
MAGNETIC ANISOTROPY;
MAGNETIC HYSTERESIS;
REMANENCE;
SPUTTER DEPOSITION;
TEXTURES;
THERMAL EFFECTS;
X RAY ANALYSIS;
CRYSTALLOGRAPHIC ALIGNMENTS;
GEOMETRIC ALIGNMENTS;
INCIDENCE ANGLE;
X RAY SCHULTZ METHOD;
MAGNETIC FILMS;
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EID: 0030206782
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-8853(95)00958-2 Document Type: Article |
Times cited : (8)
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References (16)
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