Electric potential-related reflection from transparent metal/v-SiO2/metal interfaces

Journal of Non-Crystalline Solids

Volumn 203, Issue , 1996, Pages 109-113

  Tan, C Z ^a   Arndt, J ^a  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL EFFECTS; ELECTROSTRICTION; FUSED SILICA; INDIUM; INTERFEROMETRY; LIGHT REFLECTION; RELAXATION PROCESSES; TRANSPARENCY;

ELECTRIC POTENTIAL RELATED REFLECTION; RECTANGULAR ELECTRIC FIELDS;

INTERFACES (MATERIALS);

EID: 0030206074     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(96)00340-7     Document Type: Article

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3. 2 (Plenum, New York, 1988) and references therein.
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5. S. Tolansky, Multibeam Interferometry of Surfaces and Films (Clarendon, Oxford, 1948).
6. J. Shamir, in: Handbook of Optical Constants of Solids, ed. ED. Palik (Academic Press, New York, 1985) ch. 6.
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