Conductance quantization in an atom-sized contact between an STM-tip and a metal surface

Surface Science

Volumn 363, Issue 1-3, 1996, Pages 428-433

  Kasai, Hideaki ^a   Kakuda, Tatsunori ^a   Okiji, Ayao ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Contacts; Electrical transport; Interfaces; Scanning tunneling microscopy

Indexed keywords

BINDING ENERGY; CALCULATIONS; ELECTRIC RESISTANCE; ELECTRON TRANSPORT PROPERTIES; INTERFACES (MATERIALS); MATHEMATICAL MODELS; METALS; NUMERICAL METHODS; POINT CONTACTS; SCANNING TUNNELING MICROSCOPY; SCATTERING; SURFACES;

ATOM SIZED CONTACT; CONDUCTANCE QUANTIZATION; ELECTRICAL TRANSPORT; METAL SURFACE; TIGHT BINDING MODEL;

ELECTRIC CONTACTS;

EID: 0030205809     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00282-8     Document Type: Article

References (4)

1. B.J. van Wees, H. van Houten, C.W.J. Beenakker, J.G. Williamson, L.P. Kouwenhoven, D. van der Marel and C.T. Foxon, Phys. Rev. Lett. 60 (1988) 848.
2. L. Olesen, E. Lægsgaard, I. Stensgaard, F. Besenbacher, J. Schiøtz, P. Stolze, K.W. Jacobsen and J.K. Nørskov, Phys. Rev. Lett. 72 (1994) 2251.
3. S. Nonoyama, A. Nakamura, Y. Aoyagi, T. Sugano and A. Okiji, Phys. Rev. B 47 (1993) 2423.
4. A. Okiji, H. Kasai and A. Nakamura, Prog. Theor. Phys. Suppl. 106 (1991) 209.