Auger electron-ion coincidence study for H2O adsorbed on SiO2/Si(111) at 80 K

Surface Science

Volumn 363, Issue 1-3, 1996, Pages 342-346

  Nagasono, Mitsuru ^a   Mase, Kazuhiko ^a   Urisu, Tsuneo ^a  

^a INSTITUTE FOR MOLECULAR SCIENCE   (Japan)

Author keywords

Amorphous surfaces; Auger ejection; Auger electron spectroscopy; Electron stimulated desorption (ESD); Water

Indexed keywords

ADSORPTION; AMORPHOUS MATERIALS; CHEMICAL BONDS; DESORPTION; ELECTRON TRANSITIONS; IONS; SEMICONDUCTING SILICON; SILICA; SURFACES; WATER;

AUGER EJECTION; AUGER ELECTRON ION COINCIDENCE; CORE LEVEL EXCITATIONS; COVALENT BOND; ELECTRON KINETIC ENERGY; ELECTRON STIMULATED ION DESORPTION; VALENCE ORBITALS;

AUGER ELECTRON SPECTROSCOPY;

EID: 0030205791     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00159-8     Document Type: Article

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