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Volumn 37, Issue 2, 1996, Pages 599-600
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Industrial applications of topographic and chemical imaging of polymers
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COPOLYMERS;
MICROSTRUCTURE;
MOLECULAR STRUCTURE;
MONOMERS;
POLYMER BLENDS;
PROBES;
SURFACE PROPERTIES;
BULK PERFORMANCE PROPERTIES;
PHASE IMAGING;
COLLAGEN;
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EID: 0030205156
PISSN: 00323934
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (8)
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References (0)
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