Use of normalized relative line intensities for qualitative and semi-quantitative analysis in inductively coupled plasma atomic emission spectrometry using a custom segmented-array charge-coupled device detector. Part II: Applications to qualitative analysis with line-rich matrices

Applied Spectroscopy

Volumn 50, Issue 8, 1996, Pages 959-964

  Rivier, Cedric ^a   Mermet, Jean Michel ^a  

^a UNIVERSITÉ LYON 1   (France)

Author keywords

Emission spectrometry; Inductively coupled plasma; Multichannel detection; Normalized line intensity ratio; Qualitative analysis; Steel and waspaloy analysis

Indexed keywords

ATOMIC SPECTROSCOPY; CHARGE COUPLED DEVICES; CHROMIUM; CORRELATION METHODS; DETECTORS; DIFFRACTION GRATINGS; IRON; NICKEL; PLASMA APPLICATIONS; REGRESSION ANALYSIS; STEEL ANALYSIS;

INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROMETRY (ICP AES); MULTICHANNEL DETECTION; SEGMENTED ARRAY CHARGE COUPLED DEVICE DETECTORS; WASPALOY ANALYSIS;

EMISSION SPECTROSCOPY;

EID: 0030204413     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702963905402     Document Type: Article

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