Differential cross sections for electron impact excitation of Xe: II. Excitation of the sixth to twentieth lowest levels; experiment and theory

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 29, Issue 15, 1996, Pages 3477-3486

  Khakoo, M A ^a   Trajmar, S ^a,b   Wang, S ^a,b   Kanik, I ^a,b   Aguirre, A ^a   Fontes, C J ^a,c   Clark, R E H ^a,b   Abdallah Jr , J ^a,c  

^a CALIFORNIA STATE UNIVERSITY   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SCATTERING; ELECTRON TRANSITIONS; SPECTROMETERS; SPECTROMETRY; XENON;

DIFFERENTIAL CROSS SECTIONS; ELECTRON IMPACT EXCITATION;

ATOMIC PHYSICS;

EID: 0030204406     PISSN: 09534075     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-4075/29/15/019     Document Type: Article

References (5)

1. Ester T and Kessler J 1994 J. Phys. B: At. Mol. Opt. Phys. 27 4295
2. Filipovic D, Marinkovic B, Pejcev V and Vuskovic L 1988 Phys. Rev. A 37 356
3. Fontes C J, Clark R E H, Abdallah J Jr, Csanak G, Trajmar S, Khakoo M A and Kanik I 1996 Los Alamos National Laboratory Report (in preparation)
4. Khakoo M A, Trajmar S, LeClair L R, Kanik I, Csanak G and Fontes C J 1996 J. Phys. B: At. Mol. Opt. Phys. 29 3455
5. LeClair L R, Trajmar S, Khakoo M A and Nickel J 1996 Rev. Sci. Instrum. 67 1753