![]() |
Volumn 27, Issue 5, 1996, Pages 739-750
|
Transport of submicron particles from a leak to a perpendicular surface in a chamber at reduced pressure
|
Author keywords
[No Author keywords available]
|
Indexed keywords
AEROSOLS;
DEPOSITION;
DIFFUSION IN GASES;
MATHEMATICAL MODELS;
OPTICAL MICROSCOPY;
PRESSURE EFFECTS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SURFACES;
TRANSPORT PROPERTIES;
PARTICLE DEPOSITION;
SUBATMOSPHERIC PRESSURE;
SUBMICRON PARTICLES;
PARTICLES (PARTICULATE MATTER);
LATEX;
AEROSOL;
ARTICLE;
BOUNDARY LAYER;
DIFFUSION;
EXPERIMENT;
MODEL;
PRESSURE;
PRIORITY JOURNAL;
SEMICONDUCTOR;
TEMPERATURE;
THERMODYNAMICS;
THICKNESS;
VELOCITY;
|
EID: 0030200704
PISSN: 00218502
EISSN: None
Source Type: Journal
DOI: 10.1016/0021-8502(96)00023-7 Document Type: Article |
Times cited : (5)
|
References (11)
|