Electron tomography in conical tilt geometry. The accuracy of a direct Fourier method (DFM) and the suppression of non-tomographic noise

Ultramicroscopy

Volumn 63, Issue 3-4, 1996, Pages 247-261

  Lanzavecchia, Salvatore ^a   Bellon, Pier Luigi ^a  

^a UNIVERSITY OF MILAN   (Italy)

Author keywords

electron tomography, direct Fourier methods; electron tomography, random conical tilt; noise rejection in electron tomography; noise, non tomographic

Indexed keywords

FOURIER OPTICS; FOURIER TRANSFORMS; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE; STATISTICAL TESTS;

BACK PROJECTION METHODS; CONICAL TILT GEOMETRY; DIRECT FOURIER METHOD; HAEMATIC PIGMENTS; NONTOMOGRAPHIC NOISE; PHASE AGREEMENT TESTS; SPATIAL RECONSTRUCTION KERNEL; STATISTICAL RELIABILITY INDICES; THREE DIMENSIONAL FOURIER TRANSFORM;

ELECTRON MICROSCOPY;

ARTICLE; ELECTRON MICROSCOPY; TOMOGRAPHY;

EID: 0030198737     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00043-5     Document Type: Article

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