A 200 kV electron microscopy with Schottky field emitter and a helium-cooled superconducting objective lens

Ultramicroscopy

Volumn 63, Issue 3-4, 1996, Pages 227-238

  Zemlin, F ^a   Beckmann, E ^a   Van Der Mast, K D ^b  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON GUNS; ELECTRON MICROSCOPY; FIELD EMISSION MICROSCOPES;

HIGH RESOLUTION CRYOELECTRON MICROSCOPY; SCHOTTKY FIELD EMITTER;

ELECTRON MICROSCOPES;

ARTICLE; ELECTRON MICROSCOPY; MEMBRANE;

EID: 0030198724     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00038-1     Document Type: Article

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