Automatic fault diagnosis method for resistive network using multiple excitations

International Journal of Circuit Theory and Applications

Volumn 24, Issue 4, 1996, Pages 467-477

  Kim, Dae Sik ^a   Seong, Poong Hyun ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; ELECTRIC EXCITATION; ERROR DETECTION; FAILURE ANALYSIS;

FAULT DIAGNOSIS; MULTIPLE EXCITATION; RESISTIVE NETWORK; SIMULATION AFTER TEST;

CIRCUIT THEORY;

EID: 0030196137     PISSN: 00989886     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-007X(199607/08)24:4<467::AID-CTA927>3.0.CO;2-3     Document Type: Article

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