Accelerator-based fullerene depth profiling

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 114, Issue 3-4, 1996, Pages 394-396

  Fink, D ^a   Mueller, M ^a   Klett, R ^a   Hnatowicz, V ^a   Vacik, J ^a   Mathis, C ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CESIUM; DOPING (ADDITIVES); IONS; IRRADIATION; LEACHING; LITHIUM; PARTICLE ACCELERATORS; RADIOACTIVE TRACERS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SALTS; SOLUBILITY; SOLVENTS;

DEPTH PROFILES; FULLERENE MARKING; FULLERENE TRACE PROFILING; NEUTRON DEPTH PROFILING; TETRAHYDROFURANE;

FULLERENES;

EID: 0030196053     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(96)00219-4     Document Type: Letter

References (8)

1. D. Fink R. Klett C. Mathis J. Vacik V. Hnatowicz L.T. Chadderton Nucl. Instr. and Meth. B 100 1995 69
2. D. Fink R. Klett C. Mathis J. Vacik V. Hnatowicz Radiat. Meas. 25 1995 85
3. For a general overview, see: D. Fink Neutron Depth Profiling 1994 Hahn-Meitner-Institute Berlin For more details of the used NDP arrangement, see:
4. V. Havranek V. Hnatowicz J. Kvitek J. Vacik J. Hoffmann D. Fink Nucl. Instr. and Meth. B 73 1993 523
5. D. Fink R. Klett C. Mathis J. Vacik V. Hnatowicz L.T. Chadderton Appl. Phys. A 1995/1996 to be published
6. D. Fink R. Klett H. Omichi F. Hosoi L.T. Chadderton L. Wang C. Mathis V. Hnatowicz J. Vacik Proc. Int. Conf. Radiation Effects in Insulators Catania, Italy Nucl. Instr. and Meth. B Sept. 1995 to be published
7. D. Fink F. Jahnel J. Riederer Ber. Beitr. Archäometrie 8 1983 277
8. D. Fink R. Klett W.H. Chung R. Grünwald M. Döbeli F. Ames L.T. Chadderton J. Vacik V. Hnatowicz Radiat. Eff. Def. Solids 133–134 1995 in press