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Volumn 225, Issue 1-2, 1996, Pages 103-110

Thermal stability of a-Si1-xCx:H films grown by PECVD with different gas sources

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; ANNEALING; CHEMICAL VAPOR DEPOSITION; ELECTRON SPIN RESONANCE SPECTROSCOPY; FILM GROWTH; INFRARED SPECTROSCOPY; OPTICAL VARIABLES MEASUREMENT; PHOTOLUMINESCENCE; PLASMA APPLICATIONS; THERMAL EFFECTS; THERMODYNAMIC STABILITY; VACUUM APPLICATIONS;

EID: 0030195788     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(96)00227-X     Document Type: Article
Times cited : (11)

References (23)
  • 3
    • 0004087609 scopus 로고
    • eds. by G.L. Harris and C.Y.W. Yang, Springer Proc. in Physics, New York
    • S. Furukawa, in: Amorphous and Crystalline Silicon Carbide, Vol. 34, eds. by G.L. Harris and C.Y.W. Yang, (Springer Proc. in Physics, New York, 1987) p. 58.
    • (1987) Amorphous and Crystalline Silicon Carbide , vol.34 , pp. 58
    • Furukawa, S.1
  • 6
    • 0001139722 scopus 로고
    • eds. by M.M. Rahman, G.L. Harris and C.Y.W. Yang Springer Proc. in Physics, New York
    • Y. Hamakawa, Amorphous and Crystalline Silicon Carbide II, Vol. 43, eds. by M.M. Rahman, G.L. Harris and C.Y.W. Yang (Springer Proc. in Physics, New York, 1988) p. 164.
    • (1988) Amorphous and Crystalline Silicon Carbide II , vol.43 , pp. 164
    • Hamakawa, Y.1
  • 9
    • 84897676283 scopus 로고
    • Mat. Res. Soc. Symp. Proc., Pittsburgh, Pennsylvania
    • L.R. Tessler and I. Solomon, Amorphous Silicon Technology, Vol. 336 (Mat. Res. Soc. Symp. Proc., Pittsburgh, Pennsylvania, 1994) p. 613.
    • (1994) Amorphous Silicon Technology , vol.336 , pp. 613
    • Tessler, L.R.1    Solomon, I.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.