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Volumn 164, Issue 1-4, 1996, Pages 58-65
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A detailed time of flight study of the cracking pattern of trimethylgallium; implications for MOMBE growth
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Author keywords
[No Author keywords available]
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Indexed keywords
DECOMPOSITION;
GALLIUM;
MASS SPECTROMETRY;
MOLECULAR BEAM EPITAXY;
ORGANOMETALLICS;
SEMICONDUCTING GALLIUM ARSENIDE;
SURFACES;
CRACKING PATTERNS;
MODULATED BEAM MASS SPECTROSCOPY;
TIME OF FLIGHT MEASUREMENTS;
EPITAXIAL GROWTH;
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EID: 0030195585
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-0248(96)00011-5 Document Type: Article |
Times cited : (5)
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References (12)
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