Selecting the right particle size analyzer

American Ceramic Society Bulletin

Volumn 75, Issue 7, 1996, Pages 44-48

  Geiger, Greg ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; CHARACTERIZATION; COMPUTER AIDED MANUFACTURING; MONITORING; MORPHOLOGY; OPTICAL MICROSCOPY; PARTICLE SIZE ANALYSIS; PHYSICAL PROPERTIES; PROCESS CONTROL; QUALITY CONTROL; SCANNING ELECTRON MICROSCOPY; SIZE DETERMINATION;

CERAMIC MANUFACTURING METHODS; ELECTRICAL SENSING ZONE; IN PROCESS EQUIPMENT; OPTICAL TECHNIQUES; PARTICLE SIZE ANALYZER; PARTICLE SIZE MEASURING INSTRUMENTS; POLARIZED LIGHT MICROSCOPY; PROCESS MONITORING; X RAY SEDIMENTATION; ZETA POTENTIAL;

CERAMIC MATERIALS;

EID: 0030195437     PISSN: 00027812     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (6)

1. C. Warran, "Particle-size Analysis - Present and Future," Ceram. Technol. Int., 143-46 (1995).
2. B. Scarlett, "Characterization of Particles and Powders"; pp. 99-125 in Materials Science and Technology, Vol. 17A, Processing of Ceramics Part I. Edited by R. J. Brook. VCH, Weinheim, Germany.
3. J. H. Adair, A. J. Roese and L. G. McCoy, "Particle-size Analysis of Ceramic Powders;" pp. 142-57 in Advances in Ceramics, Vol. 11, Processing for Improved Productivity. Edited by K. M. Nair. American Ceramic Society, Westerville, Ohio, 1984.
4. D. R. Johnson, M. A. Janney and F. E. McClung, "Needs Assessment for NDT and Characterization of Ceramics: I. Approach to Reliability and Assessment of Inspection and Characterization Technology for Raw Materials"; pp. 19-32 in Nondestructive Testing of High-Performance Ceramics. American Ceramic Society, Westerville, Ohio, 1987
5. H. Hilderbrand and G. Row, "Laser Light Scattering in Particle-size Analysis," Am. Ceram. Soc. Bull., 74 [7] 49-52 (1995).
6. D. F. Nicoli, J. S. Wu, Y. J. Chang, D. C. McKenzie and K. Hasapidis, "Wide Dynamic Range Particle-size Analysis by DLS-SPOS: A Combination of Two Technologies," Am. Lab., 27 [6] 41-49 (1995).