Phase relation and properties of oxynitride glasses in the Si3N4-Yb2O3-SiO2 system

Journal of Materials Science Letters

Volumn 15, Issue 14, 1996, Pages 1271-1272

  Murakami, Y ^a   Akiyama, K ^a   Yamamoto, H ^a  

^a MITSUBISHI HEAVY INDUSTRIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL THERMAL ANALYSIS; GLASS TRANSITION; HIGH TEMPERATURE APPLICATIONS; MICROSTRUCTURE; OXIDATION RESISTANCE; PARTICLE SIZE ANALYSIS; QUENCHING; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SYSTEMS (METALLURGICAL); THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION;

OXYNITRIDE GLASSES; SOFTENING TEMPERATURE; THERMOGRAVIMETRIC ANALYZER;

GLASS;

EID: 0030195275     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00274398     Document Type: Article

References (9)

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