Martensitic transformation in thin foil specimen of a shape memory TiNi alloy

Materials Transactions, JIM

Volumn 37, Issue 7, 1996, Pages 1404-1407

  Kuninori, T ^a,b   Sukedai, E ^a   Hashimoto, H ^a  

^a OKAYAMA UNIVERSITY OF SCIENCE   (Japan)

^b MEITEC Co Ltd   (Japan)

Author keywords

Convergent beam electron diffraction method; Critical thickness; In situ transmission electron microscopy observation; Shape memory alloy; Thickness dependence of martensitic transformation

Indexed keywords

COOLING; ELECTRON DIFFRACTION; MARTENSITIC TRANSFORMATIONS; METAL FOIL; SCANNING ELECTRON MICROSCOPY; SHAPE MEMORY EFFECT; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CONVERGENT BEAM ELECTRON DIFFRACTION METHOD; CRITICAL THICKNESS; SHAPE MEMORY ALLOY; THIN FOILS;

TITANIUM ALLOYS;

EID: 0030193878     PISSN: 09161821     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans1989.37.1404     Document Type: Article

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