Optical properties of thin Si-C films: Surface modification by ex-situ hydrogenation

Solid State Communications

Volumn 99, Issue 1, 1996, Pages 29-33

  Janowitz, C ^a   Kalomiros, J ^b   Ginoudi, A ^b   Paloura, E C ^b   Johnson, R L ^c  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^c UNIVERSITY OF HAMBURG   (Germany)

Author keywords

a SiC; Dielectric function; Preferential etching; Reflectivity; Synchrotron radiation

Indexed keywords

CARBON; ETCHING; HYDROGENATION; OPTICAL PROPERTIES; SILICON; SOLAR CELLS; SURFACE STRUCTURE;

DIELECTRIC FUNCTION; PREFERENTIAL ETCHING; SYNCHROTRON RADIATION;

THIN FILMS;

EID: 0030193711     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1098(96)00255-4     Document Type: Article

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