Solid solution hardening and atomic displacement parameters in La1-xCexB6 crystals

Solid State Communications

Volumn 99, Issue 4, 1996, Pages 215-219

  Korsukova, M M ^a   Gurin, V N ^a   Otani, Sh ^b   Ishizawa, Y ^b  

^a IOFFE INSTITUTE   (Russian Federation)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

A. metals; B. crystal growth; C. crystal structure and symmetry; D. mechanical properties

Indexed keywords

COMPOSITION; CRYSTAL ATOMIC STRUCTURE; CRYSTAL GROWTH FROM MELT; CRYSTAL LATTICES; CRYSTAL SYMMETRY; HARDENING; HARDNESS; LANTHANUM COMPOUNDS; MECHANICAL VARIABLES MEASUREMENT; PERCOLATION (SOLID STATE); SOLID SOLUTIONS; X RAY CRYSTALLOGRAPHY;

ATOMIC DISPLACEMENT PARAMETERS; MICROHARDNESS MEASUREMENT; SOLID SOLUTION HARDENING;

SINGLE CRYSTALS;

EID: 0030193418     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1098(96)00253-0     Document Type: Article

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