Mismatch modeling and characterization of bipolar transistors for statistical CAD

IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications

Volumn 43, Issue 7, 1996, Pages 608-610

  To, Hing Yan ^a   Ismail, Mohammed ^a  

^a Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; ELECTRIC CURRENT MEASUREMENT; MATHEMATICAL MODELS; STATISTICAL METHODS;

COLLECTOR CURRENT MISMATCH; PARAMETER MISMATCH;

BIPOLAR TRANSISTORS;

EID: 0030193132     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/81.508185     Document Type: Article

References (8)

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3. G. Massobrio and P. Antognetti, Semiconductor Device Modeling wit SPICE. 2nd ed. New York: McGraw-Hill, 1993
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5. F. Larsen and M. Ismail, "The design of high performance low cos BiCMOS op-amps in a predominantly CMOS technology," in Proc 1F.EE ISCAS, Seattle, WA, May 1995, pp. 1720-1723.
6. -, "Low cost, high performance, analog BiCMOS circuit design, in Microsystem Technology for Multimedia Applications, B. Sheu, M Ismail, E. Sanchcz-Sinencio, and T. Wu, Eds. Piscataway, NJ: IEE Press. 1995. ch. 7.6.
7. __, "Issues in the design of analog BiCMOS integrated circuits," i Proc. IEEE ISCAS, Atlanta, GA, May 1996, pp. 361-36-1
8. H.-Y. To, C.-C. Hung, H. Su. and M. Ismail, "Statistical design an optimization for high-yield BiCMOS analog circuits," in Low power H microelectronics, G. Machado, Ed., IEE Circuits and Systems Series, no 8. London, England, 1996, ch. 17.