SCOPUS 정보 검색 플랫폼

Volumn 31, Issue 14, 1996, Pages 3639-3642

Crystallization behaviour and phase coexistence at morphotrophic phase boundaries in PZT thin films prepared by sol-gel processing

(4) Ontalus, V a Cobianu, C a Vasiliu, F b Parlog, C c

a NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT IN MICROTECHNOLOGIES (Romania)

b NATIONAL INSTITUTE OF MATERIALS PHYSICS (Romania)

c INSTITUTE OF PHYSICAL CHEMISTRY (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLIZATION; GRAIN GROWTH; LATTICE CONSTANTS; LEAD COMPOUNDS; NUCLEATION; PHASE INTERFACES; SOL-GELS; SUBSTRATES; TITANIUM; X RAY DIFFRACTION; ZIRCONIUM;

LEAD ZIRCONATE TITANATE; MORPHOTROPIC PHASE BOUNDARIES; PHASE COEXISTENCE; PIEZOELECTRIC THIN FILMS; SOL GEL PROCESSING;

THIN FILMS;

EID: 0030192765 PISSN: 00222461 EISSN: None Source Type: Journal
DOI: 10.1007/BF00352771 Document Type: Article

Times cited : (5)

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