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Volumn 21, Issue 13, 1996, Pages 988-990

Resolution in three-photon fluorescence scanning microscopy

Author keywords

[No Author keywords available]

Indexed keywords

BESSEL FUNCTIONS; INTENSITY POINT SPREAD FUNCTION; LASER SCANNING MICROSCOPE; PARAXIAL APPROXIMATION; THREE PHOTON FLUORESCENCE SCANNING MICROSCOPY; WAVELENGTH;

EID: 0030191121     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.21.000988     Document Type: Article
Times cited : (71)

References (8)
  • 1
    • 0002280531 scopus 로고
    • Scanning optical microscopy
    • R. Barer and V. E. Cosselett, eds. Academic, London
    • C. J. R. Sheppard, Scanning optical microscopy," in Advances in Optical and Electron Scanning Microscopy, R. Barer and V. E. Cosselett, eds. (Academic, London, 1987), Vol. 10, pp. 1-98.
    • (1987) Advances in Optical and Electron Scanning Microscopy , vol.10 , pp. 1-98
    • Sheppard, C.J.R.1
  • 4
    • 3743069754 scopus 로고
    • Department of Electrical and Computer Engineering, State University of New York at Buffalo, Buffalo, N.Y. 14260 personal communication
    • P. C. Cheng, Department of Electrical and Computer Engineering, State University of New York at Buffalo, Buffalo, N.Y. 14260 (personal communication, 1995).
    • (1995)
    • Cheng, P.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.