Rigorous analysis of circuit parameter extraction from an FDTD simulation excited with a resistive voltage source

Microwave and Optical Technology Letters

Volumn 12, Issue 4, 1996, Pages 205-210

  Pekonen, Olli P M ^a   Xu, Jie ^a   Nikoskinen, Keijo I ^b  

^a NOKIA RESEARCH CENTER   (United States)

^b AALTO UNIVERSITY   (Finland)

Author keywords

Circuit simulations; FDTD; Microwave solid state circuits

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC EXCITATION; ELECTRIC IMPEDANCE; ELECTRIC NETWORK PARAMETERS; ELECTRIC RESISTANCE; ERRORS; FINITE DIFFERENCE METHOD; MICROWAVE CIRCUITS; TIME DOMAIN ANALYSIS;

CIRCUIT PARAMETER EXTRACTION; RESISTIVE VOLTAGE SOURCE;

COMPUTER AIDED NETWORK ANALYSIS;

EID: 0030190972     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1098-2760(199607)12:4<205::aid-mop8>3.0.co;2-k     Document Type: Article

References (9)

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