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Volumn 29, Issue 7, 1996, Pages 1689-2060
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Proceedings of the 1995 International Symposium on Atomic Bonding at Internal Interfaces: Modelling and Spectroscopy
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
CERAMIC MATERIALS;
ELECTRIC DISCHARGES;
ELECTRIC PROPERTIES;
ELECTRON ENERGY LOSS SPECTROSCOPY;
ELECTRON MICROSCOPY;
ELECTRONIC STRUCTURE;
HIGH TEMPERATURE SUPERCONDUCTORS;
MAGNETIC PROPERTIES;
OPTICAL PROPERTIES;
PLASMAS;
SEMICONDUCTOR MATERIALS;
THIN FILMS;
CRITICAL POINT ANALYSIS;
EIREV;
ELECTRON ENERGY LOSS NEAR EDGE STRUCTURES;
IONIZED CLUSTER BEAM DEPOSITION;
MOLECULAR ORBITAL CALCULATIONS;
MULTIPLE SCATTERING THEORY;
PHOTOREFRACTIVE POLYMERS;
SUM FREQUENCY GENERATION;
SURFACES;
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EID: 0030190816
PISSN: 00223727
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1088/0022-3727/29/7/003 Document Type: Conference Review |
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Times cited : (9)
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References (0)
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