메뉴 건너뛰기




Volumn 164, Issue 1-4, 1996, Pages 362-370

Materials and electrical characteristics of carbon-doped Ga0.47In0.53As using carbontetrabromide by MOMBE for HBT device applications

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CARBON; ELECTRIC PROPERTIES; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRON TRANSPORT PROPERTIES; HETEROJUNCTION BIPOLAR TRANSISTORS; MOLECULAR BEAM EPITAXY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTOR DOPING; SHAPE MEMORY EFFECT;

EID: 0030190561     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(96)00004-8     Document Type: Article
Times cited : (14)

References (21)
  • 13
    • 0022181588 scopus 로고
    • Molecular beam epitaxy and heterostructures
    • Eds. L.L. Chang and K. Ploog, Nijhoff, Dordrecht
    • R. Heckingbottom, Molecular Beam Epitaxy and Heterostructures, Eds. L.L. Chang and K. Ploog, NATO ASI Series E: Applied Sciences No. 87 (Nijhoff, Dordrecht, 1985) p. 71.
    • (1985) NATO ASI Series E: Applied Sciences No. 87 , vol.87 , pp. 71
    • Heckingbottom, R.1
  • 14
    • 0003827022 scopus 로고
    • Gas source molecular beam epitaxy
    • Springer, Berlin, ch. 5
    • For a review of these issues see, for example: M. Panish and H. Temkin, Gas Source Molecular Beam Epitaxy, Springer Series in Materials Science No. 26 (Springer, Berlin, 1993) ch. 5.
    • (1993) Springer Series in Materials Science No. 26 , vol.26
    • Panish, M.1    Temkin, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.