Effects of passing electric current on the elastic property of amorphous Cu50Zr50 and Cu50Ti50

Acta Materialia

Volumn 44, Issue 7, 1996, Pages 2787-2795

  Takemoto, R ^a,b   Nagata, M ^a,c   Mizubayashi, H ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b Ground Self Defense Force   (Japan)

^c The Works   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; CURRENT DENSITY; ELASTIC MODULI; ELECTRIC CURRENTS; ELECTROMIGRATION; RESIDUAL STRESSES; STRAIN;

COPPER TITANIUM ALLOY; COPPER ZIRCONIUM ALLOY; DYNAMIC YOUNG MODULUS; ELECTROMIGRATION FORCE; PASSING ELECTRIC DC CURRENT; STRAIN AMPLITUDE DEPENDENCE; STRUCTURAL RELAXATION;

COPPER ALLOYS;

EID: 0030189707     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/1359-6454(95)00378-9     Document Type: Article

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