Advanced RBSOA analysis for advanced power BJTs

Microelectronics Reliability

Volumn 36, Issue 7-8 SPEC. ISS., 1996, Pages 1077-1093

  Busatto, Giovanni ^a   Fratelli, Luigi ^a   Patti, Alfonso ^b  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC VARIABLES MEASUREMENT; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; POWER ELECTRONICS; STABILITY;

BIPOLAR JUNCTION TRANSISTORS; INSTABILITY MAP; METALLIZATION LAYOUT;

BIPOLAR TRANSISTORS;

EID: 0030189515     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/0026-2714(96)00031-5     Document Type: Article

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