Characterization of proton-induced color transition in an amorphous tungsten oxide film

Journal of the Electrochemical Society

Volumn 143, Issue 7, 1996, Pages 2341-2346

  Rafla Yuan, H ^a   Mathew, J G H ^a,b   Hichwa, B P ^a,b  

^a JDS UNIPHASE   (United States)

^b ELECTROCHEMICAL SOCIETY

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COLOR; ELLIPSOMETRY; LIGHT TRANSMISSION; MORPHOLOGY; PROTONS; REFRACTIVE INDEX; SURFACE ROUGHNESS; TUNGSTEN COMPOUNDS;

DOMED SURFACE STRUCTURE; PROTON INDUCED COLOR TRANSITION; TUNGSTEN OXIDE; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY;

AMORPHOUS FILMS;

EID: 0030189005     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1837003     Document Type: Article

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