Temperature measurement under concentrated radiation

Solar Energy

Volumn 58, Issue 1-3, 1996, Pages 69-75

  Schubnell, M ^a   Tschudi, H R ^a   Muller Chr ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030186795     PISSN: 0038092X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-092X(96)00038-2     Document Type: Conference Paper

References (10)

1. Kan V. V. and Salikhov T. P. (1993) Subsecond measurements of the optical properties in the spectral range 0.4-1.1 μm near high temperature transformations of samarium oxide. Int. J. Thermophysics 14, 555-564.
2. Riskiev T. T., Salikhov T. P. and Kan V. V. (1994) New principles of determining the true temperature in solar imaging furnaces. In Solar Engineering, Klett D. E., Hogan R. E. and Tanaka T. (Eds) ASME (American Society of Mechanical Engineers), pp. 41-45.
3. Salikhov T. P., Khan V. V. and Riskiev T. T. (1992) The probing-flash method in the study of the radiation properties of refractory materials. High Temperatures - High Pressures 24, 659-664.
4. Schubnell M., Keller J. and Imhof A. (1991) Flux density distribution in the focal region of a solar concentrator system. J. Sol. Energy Engng 113, 112-116.
5. Schubnell M., Tschudi H. R., Kuhn P. and Ries H. (1993) Reflectivity as a probe for chemical reactions. Proc. Ind. Acad. Sci. (Chem. Sci.) Vol. 105, pp. 671-675.
6. Schubnell M. and Tschudi H. R. (1995) Simultaneous measurement of irradiation, temperature and reflectivity on hot irradiated surfaces. Appl. Phys. A 60, 581-587.
7. Seitz T. (1995) Sunflux: a flux measurement system for solar concentrators. Minutes of the Solar Paces Task III Meeting, DLR Koeln.
8. Sweatt W. C. and Phipps G. S. (1992) Solar-blind imaging radiometry. In Solar Engineering, Stine E., Kreider J. and Watanabe K. (Eds) ASME (American Society of Mechanical Engineers), pp. 1025-1028.
9. Tschudi H. R. (1994) Simultaneous measurement of emissivity, temperature and irradiance on illuminated hot surfaces. Technical Report TM-51-94-02, Paul Scherrer Institute, CH-5232, Villigen-PSI.
10. Welford W. T. and Winston R. (1990) High Collection Non-imaging Optics. Academic Press, New York.