Advanced CMOS protection device trigger mechanisms during CDM

IEEE transactions on components, packaging and manufacturing technology. Part C. Manufacturing

Volumn 19, Issue 3, 1996, Pages 169-177

  Duvvury, Charvaka ^a   Amerasekera, Ajith ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; FAILURE ANALYSIS; INTEGRATED CIRCUITS; PERFORMANCE; SEMICONDUCTOR DEVICE MODELS; SIMULATION;

CHARGED DEVICE MODEL; DEVICE SIMULATION; ELECTRONIC DISCHARGES; PROTECTION CIRCUITS; SILICON CONTROLLED RECTIFIER;

MOSFET DEVICES;

EID: 0030182962     PISSN: 10834400     EISSN: None     Source Type: Journal    
DOI: 10.1109/3476.558865     Document Type: Article

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