Interface structure and magnetic and electrical properties of Fe/Ti multilayers

Journal of Magnetism and Magnetic Materials

Volumn 160, Issue , 1996, Pages 357-358

  Czapkiewicz, M ^a   Stobiecki, T ^a   Kopcewicz, M ^b  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^b ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

Author keywords

Amorphization; Coercivity; Electrical conductivity; Multilayers; X ray diffraction

Indexed keywords

COERCIVE FORCE; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY MEASUREMENT; FILM PREPARATION; GRAIN BOUNDARIES; INTERFACES (MATERIALS); IRON ALLOYS; MAGNETIC PROPERTIES; MAGNETIC VARIABLES MEASUREMENT; SPUTTER DEPOSITION; X RAY DIFFRACTION;

AMORPHOUS PHASE; COERCIVITY MEASUREMENT; CRYSTALLINE SUBLAYERS; INTERFACE STRUCTURE;

MULTILAYERS;

EID: 0030181910     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-8853(96)00228-4     Document Type: Article

References (7)

1. K. Samwer, Phys. Rep. 161 (1988) 1.
2. B. Rodmacq, J. Hillairet and A. Chamberod, J. Phys. Condensed Matter 2 (1990) 95.
3. M. Kopcewicz, J. Jagielski, T. Stobiecki, F. Stobiecki and G. Gawlik, J. Appl. Phys. 76 (1994) 5232.
4. M. Czapkiewicz and T. Stobiecki, J. Magn. Magn. Mater. 148 (1995) 333.
5. M. Kopcewicz, T. Stobiecki, A. Grabias and M. Czapkiewicz, ICAME'95, Rimini, 10-16 Sept. 1995, Nuovo Cimento, to be published.
6. T. Otto, T. Stobiecki, F. Stobiecki and K. Roll, J. Magn. Magn. Mater. 101 (1991) 207.
7. L. Smardz, H. Niedoba, B. Mirecki, F. Stobiecki and B. Szymański J. Magn, Magn. Mater. 140-144 (1995) 1899.