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Volumn 68, Issue 13, 1996, Pages 2031-2037

Enhanced signal-to-background ratios in voltammetric measurements made at diamond thin-film electrochemical interfaces

Author keywords

[No Author keywords available]

Indexed keywords

CYCLIC VOLTAMMETRY; ELECTRODES; INTERFACES (MATERIALS); THIN FILMS;

EID: 0030181176     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac9506847     Document Type: Article
Times cited : (142)

References (36)
  • 2
    • 0009661538 scopus 로고
    • Angus, J. C.; Hayman, C. C. Science 1988, 241, 913. Geis, M. W.; Angus, J. C. Sci. Am. 1992, Oct, 84.
    • (1988) Science , vol.241 , pp. 913
    • Angus, J.C.1    Hayman, C.C.2
  • 3
    • 0009661538 scopus 로고
    • Oct
    • Angus, J. C.; Hayman, C. C. Science 1988, 241, 913. Geis, M. W.; Angus, J. C. Sci. Am. 1992, Oct, 84.
    • (1992) Sci. Am. , pp. 84
    • Geis, M.W.1    Angus, J.C.2
  • 25
    • 0001267544 scopus 로고
    • Zak, J.; Kuwana, T. J. Electroanal. Chem. 1983, 150, 645. Hu, I.-F.; Karweik, D. H.; Kuwana, T. J. Electroanal. Chem. 1985, 188, 59.
    • (1983) J. Electroanal. Chem. , vol.150 , pp. 645
    • Zak, J.1    Kuwana, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.