Method of ellipsometry in the synthesis technology of cadmium-mercury-tellurium compounds

Avtometriya

Volumn , Issue 4, 1996, Pages 100-109

  Svitashev, K K ^a   Shvets, V A ^a   Marderzhov, A S ^a   Dvoretskij, S A ^a   Sidorov, Yn G ^a   Spesivtsev, E V ^a   Rykhlitskij, S V ^a   Chikichev, S I ^a   Pridachin, D N ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; FABRICATION; FILM GROWTH; MOLECULAR BEAM EPITAXY; PHOTODETECTORS; TECHNOLOGY; THERMAL EFFECTS;

BUFFER LAYERS; SURFACE MORPHOLOGY;

SEMICONDUCTING TELLURIUM COMPOUNDS;

EID: 0030181093     PISSN: 03207102     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (24)