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Volumn 6, Issue 1-2, 1996, Pages 35-39
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Determination of the thermal properties of semiconductors using the photothermal method in the many thin layers case
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Author keywords
[No Author keywords available]
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Indexed keywords
CALCULATIONS;
HETEROJUNCTIONS;
MATHEMATICAL MODELS;
MICROELECTRONICS;
OPTOELECTRONIC DEVICES;
SEMICONDUCTING FILMS;
TEMPERATURE;
THERMODYNAMIC PROPERTIES;
THICKNESS MEASUREMENT;
MICROOPTOELECTRONICS;
PHOTOTHERMAL METHOD;
SEMICONDUCTOR MATERIALS;
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EID: 0030180655
PISSN: 09253467
EISSN: None
Source Type: Journal
DOI: 10.1016/0925-3467(96)00019-5 Document Type: Article |
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Times cited : (11)
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References (1)
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