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Volumn 34, Issue 11, 1996, Pages 1723-1727
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The incidence of symmetric tilt grain boundaries in polycrystalline thin films of gold
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CRYSTAL ORIENTATION;
CRYSTAL SYMMETRY;
EVAPORATION;
FILM PREPARATION;
GRAIN BOUNDARIES;
GRAIN GROWTH;
INTERFACES (MATERIALS);
POLYCRYSTALLINE MATERIALS;
PROBABILITY;
THIN FILMS;
VACUUM;
BOUNDARY PLANE DISTRIBUTION;
POLYCRYSTALLINE THIN FILMS;
SYMMETRIC TILT GRAIN BOUNDARIES;
THERMAL EVAPORATION;
THREE FOLD SYMMETRY;
GOLD;
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EID: 0030174746
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/1359-6462(96)00042-5 Document Type: Article |
Times cited : (14)
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References (8)
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